JOURNAL OF BEIJING UNIVERSITY OF POSTS AND TELECOM ›› 2010, Vol. 33 ›› Issue (3): 112-116.doi: 10.13190/jbupt.201003.112.wangd
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Simulation Test of Mobile Phone Dust Ingression
WANG Dong,XU Liang-jun,YIN Zhu-ling,ZHANG Hao,ZHU Meng
(School of Automation, Beijing University of Posts and Telecommunications, Beijing 100876, China)